Exact regret envelopes for commitment-constrained manufacturing under joint capacity stress
A feasible manufacturing adjustment can preserve mandatory commitments while losing most of the contribution attainable through reoptimization. This paper studies nominal-surplus scaling under simultaneous capacity losses and increasing production floors. For arbitrary finite product and resource counts with nonnegative resource use, it derives the exact feasible stress interval and a finite breakpoint audit of the largest scaled-plan regret. A two-product family with strictly positive resource coefficients and positive commitments proves that the optimum-to-scaled-value ratio can grow without bound. A dual-certificate tracing procedure supplies an interval-wide regret bracket without enumerating every dual vertex. The generic tracing principle is established parametric optimization; its specialization here couples commitment-adjusted scaling with a complete regret audit. An explicit two-resource model also gives exact product-mix transitions, shadow prices and coefficient-uncertainty limits. Experiments cover 90 manufacturing instances and compare oracle tracing, direct optimizer grids and independently enumerated dual envelopes. The trace requires a mean of 3.58 LP queries on these instances; 62 have an interior regret maximum, and a 101-point grid understates the largest regret by up to 0.4425 accounting units. These synthetic results support complete-path auditing rather than extrapolation from a nominal shadow price.